Announcing a new short course series in utilizing the advanced instrumentation and expertise available in the Imaging and Analysis Center
The Imaging and Analysis Center (IAC) (http://www.princeton.edu/~iac) at the Princeton Institute for the Science and Technology of Materials. Princeton University welcomes the opportunity to facilitate broad usage of its state-of-the-art instrumentation and expertise in materials research and education. As a crucial component of this effort, the IAC is initiating a new program to further promote education in experimental methods of imaging and analysis. We will provide a series of free group training courses for future IAC users to the Princeton community. The training courses involve direct experimental demonstrations and hands-on instruction in the use of all IAC equipments ranging from basic sample preparation device to high-end electron microscopes. These 3-6 hour courses are offered regularly and frequently, so that users can receive basic training when they anticipate an imminent need for the technique. The training courses thus complement PRISM's "for-credit" course, MSE 505 (Characterization of Materials) which covers the principles and applications of all these techniques in depth. The topics are listed below.(Click on the individual topic to get more information and the training schedule)
Safety is a top priority at Princeton University. Please take time to review the Environmental Health and Safety website. Thank you!
|To use IAC equipment and sign up for training courses... Register an email address here|
|Need assistance with IAC equipment? Click here!|
|Check out our current Instrument Rates|
Basic sample preparation for microscopy
|1a.||Sample preparation for SEM, XRD, Microprobe and FIB|
|1b.||TEM sample preparation for soft materials (by ultramicrotomy)|
|1c.||TEM sample preparation for hard materials (by ion milling)|
Basic operation of various imaging and analysis instruments
Advanced operation of various imaging and analysis instruments
1. Attendants are required to have previous training and practice in use of the XL30 SEM (2b).
2. Attendants are required to have previous training and practice in use of the Rigaku Miniflex XRD (2a).
3. Attendants are required to have previous training and practice in use of the Quanta 200 FE-ESEM (3b).
4. Attendants are required to have previous training and practice in use of the Veeco Multimode AFM (2d).
5. Attendants are required to have previous training and practice in use of the CM100 TEM (2c).