Training

Sample preparation for SEM, Microprobe and FIB

Most specimens must undergo some sort of sample preparation before scanning electron microscopy, electron microprobe or focused ion beam analysis may be performed. This course will provide basic training on how to prepare samples prior to imaging and analysis, which will include: mounting the samples on the various sample mounts; discussion of the different available mounts; discussion of the purpose & types of conductive coatings; training on the Ion Beam Sputterer & the Carbon Coater to make conductive coatings; embedding samples in suitable resins & polishing embedded samples to get the smooth surface.

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Leica Sputter Coater Operations Manual
Operation manual for the IBS ion sputterer
Cressington Carbon Coater Procedure