Operation of an atomic force microscope (Bruker Multimode AFM)
Atomic force microscopy (AFM) probes the sample surface with a sharp tip (diameter of apex 10 nm) connected to a cantilever. The deflection of the cantilever with tip position is then measured using a laser beam reflected off the back of the cantilever onto a photodiode.
This technique can provide: (a) topographic images down to the sub-nanometer resolution in air and liquid without the need for any additional surface preparation; (b) phase imaging and frictional force measurements to distinguish between different materials and phases; and (c) adhesion measurements and mechanical properties of single molecules. The instrument to be used is a DI Nanoscope IIIa Atomic Force Microscope, which can perform "imaging by touch" to image surface topography either by contact mode or "tapping" mode, either in ambient atmosphere or in a liquid environment.
No course Dates on File!