Training

Operation of atomic force microscope (Bruker Dimension NanoMan AFM)

The Dimension NanoMan AFM provides a variety of high resolution surface imaging and property measurement techniques, as well as the ability to manipulate or create nanoscale structures. This system incorporates the Dimension™ platform, the advanced NanoScope V controller and the sophisticated Hybrid XYZ scanner to create the preeminent system for high-resolution imaging, high-definition nanolithography, and direct nanoscale manipulation. NanoMan is also able to perform highly accurate force curves, nanoindenting and "pulling techniques". This new state-of-the-art AFM operates in closed-loop mode in all three axes, enabling a single instrument solution for nanolithography, nanomanipulation, and imaging for material and life science applications. Equipped with a full spectrum HarmoniX package and TR TUNA cantilever holder, this system offers high-resolution, high speed imaging and conductivity measurement at pA range.

References
Please visit the following site for latest references:
http://www.tecsco.co.kr/data/2008SPMGuideBook.pdf

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Bruker Dimension Nanoman AFM