Training

Operation of High-resolution Scanning Transmission Electron Microscope
(Talos F200X S/TEM with SuperX-EDS)

Room temperature S/TEM imaging and analysis including differential phase contrast (DPC), bright field, dark field and high-angle annular dark field imaging, electron diffraction, highly sensitive 4-detector Super-X EDS for quantitative elemental analysis and mapping.

• X-FEG high brightness electron source (1.8x109 A/cm2srad @200 kV) with 0.12 nm (TEM), 0.16 nm (STEM) information limit
• flexible high tension range from 60 to 200 kV
• constant power A-TWIN objective lens for thermal stability and easy mode switching
• industry-leading high-speed, high-throughput, windowless 4-detector, Super-X energy dispersive X-ray spectroscopy (EDS) signal detection
• differential phase contrast (DPC) imaging for electromagnetic studies
• automatic apertures and reproducible recall
• rotation-free imaging for clear orientation
• constant power A-TWIN objective lens for thermal stability and easy mode switching