Training

Operation of Transmission Electron Microscope (Philips CM200 TEM)

With a field-emission-gun, this microscope provides structural information at better than 0.2 nm spatial resolution, and an electron probe of 1 nm with energy up to 200KeV.
In most crystalline inorganic materials, including ceramics, semiconductors and metals, the positions of individual atomic columns can be resolved, at least in low-index zones. When recorded under optimum conditions, electron micrographs can be directly interpreted in terms of the projected crystal potential. In other cases, image simulations are necessary to match proposed structures to image features. Dynamic events induced by the electron beam or indirectly with a heating holder can be followed by videotape recording from a TV-rate image pick-up system. At lower resolution, amplitude contrast images can be used to observe material features in the 1µm-0.5nm range. In this microscope, the electron nano-diffraction and nano-analysis method can be used to obtain localized structural and elemental information at nanoscale. With a 1 nm incident electron probe, the information from the region only covers one or two unit cells can be readily collected.

References

  1. D. B. Williams and C. B. Carter, Transmission Electron Microscopy (Plenum, New York, 1996)
  2. D.J. Smith, Reports Prog. Phys. (1997) p. 1513-1580.
  3. P.R. Buseck, J.M. Cowley, and L. Eyring, Eds., High-Resolution Transmission Electron Microscopy and Associated Techniques (Oxford University Press, New York, 1988)
  4. J.C.H. Spence, in: Experimental High Resolution Electron Microscopy (Oxford University Press, 1988, 2nd ed.).
  5. P. Hirsch, et al, in: Electron Microscopy of Thin Crystals (Krieger, Malabar FLA, 1977).



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Operation manual for the Philips FEG CM200-TEM