Training

Basic operation of a transmission electron microscope (Philips CM100 TEM)

The Transmission Electron Microscope (TEM) allows the user to determine the internal structure of materials, either of biological or non-biological origin. TEM images are typically viewed as 2D projections of a 3D structure. By tilting a sample in the microscope it becomes possible to derive information, which can be used to reconstruct samples in 3D. The Philips CM100 is a conventional TEM, which is designed for routine operation combining user friendliness with excellent imaging performance and versatility. The instrument allows constant image brightness regardless of magnification. Digital imaging can be achieved through a CCD camera in real time, so images can be obtained, analyzed and manipulated without the nee to develop photographic negatives and make prints. This microscope is normally operated at 100 KeV and is equipped with a digitally controlled eucentric 4-axis motorized side entry stage, which provides a maximum tilting angle of 60 degrees. It provides optimum resolution of 0.45nm (point to point), with continuous zoom from 40x to 600,000x with no image rotation.

References

  1. D. B. Williams and C. B. Carter, Transmission Electron Microscopy (Plenum, New York, 1996)
  2. D.J. Smith, Reports Prog. Phys. (1997) p. 1513-1580.
  3. P.R. Buseck, J.M. Cowley, and L. Eyring, Eds., High-Resolution Transmission Electron Microscopy and Associated Techniques (Oxford University Press, New York, 1988)
  4. J.C.H. Spence, in: Experimental High Resolution Electron Microscopy (Oxford University Press, 1988, 2nd ed.).
  5. P. Hirsch, et al, in: Electron Microscopy of Thin Crystals (Krieger, Malabar FLA, 1977).



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Operation manual for the Philips CM100 TEM