Training

Announcing a new short course series in utilizing the advanced instrumentation and expertise available in the Imaging and Analysis Center

The Imaging and Analysis Center (IAC) (http://www.princeton.edu/~iac) at the Princeton Institute for the Science and Technology of Materials. Princeton University welcomes the opportunity to facilitate broad usage of its state-of-the-art instrumentation and expertise in materials research and education. As a crucial component of this effort, the IAC is initiating a new program to further promote education in experimental methods of imaging and analysis. We will provide a series of free group training courses for future IAC users to the Princeton community. The training courses involve direct experimental demonstrations and hands-on instruction in the use of all IAC equipments ranging from basic sample preparation device to high-end electron microscopes. These 3-6 hour courses are offered regularly and frequently, so that users can receive basic training when they anticipate an imminent need for the technique. The training courses thus complement PRISM's "for-credit" course, MSE 505 (Characterization of Materials) which covers the principles and applications of all these techniques in depth. The topics are listed below.(Click on the individual topic to get more information and the training schedule)

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Basic sample preparation for microscopy

1a. Sample preparation for SEM, XRD, Microprobe and FIB
1b. TEM sample preparation for soft materials (by ultramicrotomy)
1c. TEM sample preparation for hard materials (by ion milling)

Basic operation of various imaging and analysis instruments

2a. Operation of an x-ray diffractometer (Rigaku Miniflex XRD)
2b. Operation of a scanning electron microscope (XL30 FEG-SEM)
2c. Operation of a transmission electron microscope (Philips CM100 TEM)
2d. Operation of an atomic force microscope (Veeco Multimode AFM)
2e. Operation of an Ellipsometer (M-2000)
2f. Operation of a Raman Spectrometer (Horiba)

Advanced operation of various imaging and analysis instruments

3a. Operation of EVEX energy dispersed x-ray spectroscopy for microanalysis (operated with XL30 FEG-SEM )1
3b. Operation of an environmental scanning electron microscope (Quanta 200 FE-ESEM)1
3c. Operation of the dual-beam focused ion beam system (Strata DB-235 Dual-Beam focused ion beam (FIB) system)1
3d. Operation of a high-resolution x-ray diffractometer (Bruker D8 Discover)2
3e. Operation of Oxford energy and wave dispersed x-ray spectroscopy (EDS and WDX operated with Quanta FE-ESEM)3
3f. Operation of Oxford energy dispersed x-ray spectroscopy and electron backscattering diffraction system (EDS and EBSD operated with Quanta FE-ESEM)3
3g. Operation of atomic force microscope (Veeco Dimension NanoMan AFM)4
3h. Operation of a high-resolution transmission electron microscope (Philips CM200 FEG-TEM)5

1. Attendants are required to have previous training and practice in use of the XL30 SEM.
2. Attendants are required to have previous training and practice in use of the Rigaku Miniflex XRD.
3. Attendants are required to have previous training and practice in use of the Quanta 200 FE-ESEM.
4. Attendants are required to have previous training and practice in use of the Veeco Multimode AFM.
5. Attendants are required to have previous training and practice in use of the CM100 TEM.