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Operation of an atomic force microscope (Bruker Multimode AFM) Instrument:AFM DM
Operation of Dimension Atomic Force Microscope (Bruker Dimension NanoMan AFM) Instrument:AFM Nanoman
Operation of a Rheometer (Anton Paar MCR501) Instrument:Anton Paar MCR501 Rheometer
Operation of a Twin-Motor Rheometer (Anton Paar MCR702) Instrument:Anton Paar MCR702 Rheometer
Operation of Aquilos 2 Cryo - FIB Instrument:Aquilos 2 Cryo-Focused Ion Beam
Operation of Dimension Atomic Force Microscope (Bruker Dimension ICON3 AFM) Instrument:Bruker ICON3 AFM
Operation of a high-resolution x-ray diffractometer(Bruker D8 Discover) Instrument:Bruker XRD
Sample Preparation for SEM, Microprobe and FIB Instrument:Carbon Coater
Basic operation of a transmission electron microscope (Philips CM100 TEM) Instrument:CM100 TEM
Operation of Transmission Electron Microscope (Philips CM200 TEM) Instrument:CM200 TEM
Operation of a Thermo FTIR Imaging Microscope (Nicolet iN10 MX) Instrument:FTIR Nicolet iN10 MX Infrared Microscope
Operation of Focused Ion Beam System (FEI Helios G3 DualBeam FIB/SEM) Instrument:Helios FIB
Operation of a Raman Spectrometer (Horiba) Instrument:Horiba Raman
Sample Preparation for SEM, Microprobe and FIB Instrument:Ion Beam Sputterer
TEM sample preparation for hard materials (by ion milling) Instrument:Ion Mill
Operation of a Keyence VK-X3050 Confocal Micro-optical System Instrument:Keyence VK-X3050 Confocal Microscope
Operation of a Confocal Micro-optical System (Leica DCM3D) Instrument:Leica DCM3D Confocal
Sample Preparation for SEM, Microprobe and FIB Instrument:Leica Sputter Coater
Operation of an Ellipsometer (Woollam M-2000) Instrument:M-2000 Ellipsometer
Sample Preparation for SEM, Microprobe and FIB Instrument:Multiprep Polisher
Operation of Thermo Analysis Equipment (DSC, DMA) Instrument:PE DSC-DMA
Operation of Thermo Analysis Equipment (TGA-GC/MS) Instrument:PE TGA-GC/MS
Operation of a Photoluminescence Spectrometer (Edinburgh Instruments, FLS980) Instrument:Phosphorescence Fluorescence Spectrometer
Operation of an environmental scanning electron microscope (Quanta 200 FE-ESEM) Instrument:Quanta ESEM
Operation of Energy Dispersed X-ray Spectroscopy for Microanalysis (Oxford INCA EDS operated with Quanta FEG-SEM) Instrument:Quanta ESEM
Operation of Oxford Energy Dispersed Spectroscopy with Quanta 200F ESEM Instrument:Quanta ESEM
Operation of Wave Dispersed X-ray Spectroscopy and Electron BackScattering Diffraction (WDS and EBSD operated with Quanta FE-ESEM) Instrument:Quanta ESEM
Basic operation of a Powder X-ray Diffractometer (Rigaku Miniflex XRD) Instrument:Rigaku XRD
Operation of a Small Angle X-ray Scattering System (Xenocs Xeuss 3.0) Instrument:Small-angle X-ray Scattering System (SAXS)
Operation of High-resolution Scanning Transmission Electron Microscope (Talos F200X S/TEM with SuperX-EDS) Instrument:Talos F200X TEM
Operation of a Transmission Electron Microscope (Talos L120C G2 TEM) Instrument:Talos L120C G2 Transmission Electron Microscope
Operation of the X-ray Photoelectron Spectrometer (Thermo K-alpha XPS-UPS) Instrument:Thermo Scientific K-Alpha XPS-UPS System
Operation of Ultra High-resolution Double Cs-corrected Scanning Transmission Electron Microscope (Titan Themis 80-300 Cubed S/TEM) Instrument:Titan Cubed Themis 300
Operation of Krios G3 Cryo - TEM Instrument:Titan Krios G3 CryoTEM
Operation of Krios G4 Cryo - TEM Instrument:Titan Krios G4 CryoTEM
TEM sample preparation for soft materials (by ultramicrotomy) Instrument:Ultracut Microtome UCT
Operation of a UV-Vis Spectrometer (Agilent Technologies, Cary 5000) Instrument:UV-VIS Cary 5000
Operation of High-resolution, Low-voltage Scanning Electron Microscope (FEI Verios 460 XHR SEM) Instrument:Verios 460 XHR SEM
TEM sample preparation for biological or soft materials (by plunge-freezing) Instrument:Vitrobot IAC
TEM sample preparation for biological or soft materials (by plunge-freezing) Instrument:Vitrobot MOL
Basic operation of a scanning electron microscope (XL30 FEG-SEM) Instrument:XL30 SEM
MSE505 Characterization of Materials Instrument:Zeiss Axioscope A1
Operation of a Polarized Light Microscope (Zeiss AxioScope A1) Instrument:Zeiss Axioscope A1
Operation of 3D X-ray Microscope (Zeiss Xradias Versa 630) Instrument:Zeiss Xradias Versa 630