Training

Operation of a high-resolution x-ray diffractometer (Bruker D8 Discover)

This XRD is a state-of-the-art, high-quality system that is easy to use, highly accurate, and versatile to meet our needs in X-ray diffraction. This system equips with the optimum components (X-ray monochromator, high-precision, two-circle goniometer, LynxEye detector and standard software package) to provide a comprehensive solution for X-ray reflectometry, High resolution X-ray diffraction, Grazing incidence diffraction and texture measurements, as well as µm-XRD. One of the unique advantages of this system is its extreme versatility. The system can be easily reconfigured for the usage of multiple research groups for different applications. The combination of various measurement methods in this single instrument allows us to use it during all phases of complex materials development. This XRD also provides special capability with several special attachments to meet our research needs. These features include:

• A LynxEye detector that operates both in a 1-Dimensional Mode (for polymers and powders) and also in a 0 Dimensional Mode (for thin film and grazing incidence analysis, reciprocal space mapping) provides high resolution detection for nearly all applications
• A Laser-Video Scope for accurate alignment and positioning of any type of samples
• A DCS 350 temperature stage (-100°C to 350°C)
• A MRI Hot Humidity Stage (25°C - 90°C, up to 90% relative humidity)
• A full TOPAS and MULTEX software package for powder pattern fitting, pattern decomposition, quantitative structure refinement, ab-initio structure determination, and pole figure measurement, etc.

References

1. Azároff, L. V., R. Kaplow, N. Kato, R. J. Weiss, A. J. C. Wilson, R. A. Young (1974). X-ray diffraction. McGraw-Hill.
2. Glatter, O., O. Kratky (1982). Small Angle X-ray Scattering. Academic Press. http://physchem.kfunigraz.ac.at/sm/Software.htm.
3. Cullity, B.D. and S. R. Stock (2001) Elements of X-Ray Diffraction, Third Edition, Addison-Wesley