Training

Operation of Dimension Atomic Force Microscope (Bruker Dimension ICON3 AFM)

The Icon3® atomic force microscope (AFM) introduces new levels of performance, functionality, and AFM accessibility to nanoscale researchers in science and industry; high performance, multifunctional, scanning probe microscope (SPM) optimized for peak force characterization.

  • housed within an integrated acoustic and vibration isolation enclosure to ensure optimal data collection
  • motorized stage with a typical X-Y scan range of 90μm x 90μm
  • various advanced operation modes including: PeakForce Tapping/contacting, Force spectroscopy, Surface potential, Piezoresponse microscopy, Tunneling AFM, etc.

Please be aware that this course has the following pre-requisite (or equivalent experience): "Operation of atomic force microscope (Bruker Dimension NanoMan AFM) ". Questions about your qualification to enroll in this course should be directed to Nan Yao, director of the Imaging and Analysis Center. Please do not enroll in this course unless you are certain you have met the pre-requisite requirements. Thank you!

Schedule

Dates
Times
Status
03/29/2024
9:30am - 12noon
CLOSED
04/29/2024
9:30am - 12noon
05/29/2024
9:30am - 12noon
06/28/2024
9:30am - 12noon
07/31/2024
9:30am - 12noon
08/29/2024
9:30am - 12noon


Bruker Dimension ICON3 AFM manual