Training

Operation of Ultra High-resolution Double Cs-corrected Scanning Transmission Electron Microscope (Titan Themis 80-300 Cubed S/TEM)

The premiere aberration-corrected S/TEM for atomic-resolution characterization, including differential phase contrast (DPC), bright field, dark field and high-angle annular dark field imaging, electron diffraction, and quantitative elemental analysis/mapping, and EELS acquisition.

• a Schottky X-FEG high brightness electron source with 0.08 nm (TEM), 0.07 nm (STEM) information limit
• double Cs-corrector DCOR (Cs image + DCOR probe corrector)
• flexible high tension range from 60 to 300 kV
• symmetric Ruska-Rieke constant power S-TWIN objective lens for thermal stability and easy mode switching
• industry-leading high-speed, high-throughput, windowless 4-detector, Super-X energy dispersive X-ray spectroscopy (EDS) signal detection
• a Gatan Quantum SE/963 P post-column energy filter equipped with a 2k x 2k CCD for energy filtered TEM (EFTEM) and UltraFast (up to 1000sp/s) electron energy-loss spectra (EELS) data acquisition
• differential phase contrast (DPC) imaging for electromagnetic studies
• automatic apertures and reproducible recall
• rotation-free imaging for clear orientation
• computerized 5-axis specimen stage with piezo-enabled drift compensation